Daisuke Fujita , Debra L. Kaiser , Elisabeth Mansfield , Marcel Van De Voorde

Metrology and Standardization for Nanotechnology

Protocols and Industrial Innovations

Wiley-VCH

Collection : Applications of Nanotechnology

Date de publication : 2017-01-20

For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products.
First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.

183,52

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À propos

Éditeur
Parution
2017-01-20
Pages
626 pages
EAN papier
9783527340392

Caractéristiques détaillées - droits

EAN PDF
9783527800056
Prix
183,52 €
Nombre pages copiables
0
Nombre pages imprimables
626
Taille du fichier
48927 Ko
EAN EPUB
9783527800292
Prix
183,52 €
Nombre pages copiables
0
Nombre pages imprimables
626
Taille du fichier
11459 Ko

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